Label Value
DOI 10.1038/s41598-017-05067-9
TITLE On the influence of interface charging dynamics and stressing conditions in strained silicon devices
TYPE article
PUBLICATION DATE 2017-08-03
Service Status Date
Scopus Yes 2018-02-12T10:31:19.202634
Web of Science Yes 2018-04-08T06:12:08.299849
Compendex No 2019-12-18T12:31:44.833274